Skip to main navigation Skip to search Skip to main content

Application of 3d models in intelligent visual inspection of product anomalies

  • Feifei Kong
  • , Yunxia Lu
  • , Fuzhou Du*
  • *Corresponding author for this work
  • Beihang University
  • Beijing Satellite Manufacturing Factory Co., Ltd.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Due to its advantages of non-contact, high efficiency, and digitization, machine vision has been extensively utilized in product appearance anomaly inspection. The advancement of deep learning has significantly propelled the digitization and intelligence process of visual inspection. Nonetheless, the current learning paradigm still heavily relies on a large quantity of high-quality training samples, and exhibits limited capability in detecting anomaly categories beyond the training set (also known as open-set detection). Aiming at these challenges and inspired by the model-driven digital inspection idea, this article advocates for the thorough exploration of the auxiliary potential of 3D models in visual inspection. Diverging from the traditional paradigm, which mainly leverages digital models as data management centers, this article explicitly highlights two additional critical functions of 3D models: knowledge carriers and detection references. The efficacy of the proposed approach is demonstrated through case studies.

Original languageEnglish
Title of host publicationThird International Conference on Advanced Manufacturing Technology and Manufacturing Systems, ICAMTMS 2024
EditorsKe Zhang, Dailin Zhang
PublisherSPIE
ISBN (Electronic)9781510681804
DOIs
StatePublished - 2024
Event3rd International Conference on Advanced Manufacturing Technology and Manufacturing Systems, ICAMTMS 2024 - Changsha, China
Duration: 24 May 2024 → 26 May 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13226
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference3rd International Conference on Advanced Manufacturing Technology and Manufacturing Systems, ICAMTMS 2024
Country/TerritoryChina
CityChangsha
Period24/05/24 → 26/05/24

Keywords

  • digital model
  • inspection reference
  • intelligent manufacturing
  • knowledge carrier
  • visual inspection

Fingerprint

Dive into the research topics of 'Application of 3d models in intelligent visual inspection of product anomalies'. Together they form a unique fingerprint.

Cite this