Antiferromagnetic imaging via ptychographic phase retrieval

  • Jizhe Cui
  • , Haozhi Sha
  • , Wenfeng Yang
  • , Rong Yu*
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Antiferromagnetic imaging is critical for understanding and optimizing the properties of antiferromagnetic materials and devices. Despite the widespread use of high-energy electrons for atomic-scale imaging, they have low sensitivity to spin textures. Typically, the magnetic contribution to the phase of a high-energy electron wave is weaker than one percent of the electrostatic potential. Here, we demonstrate direct imaging of antiferromagnetic lattice through precise phase retrieval via electron ptychography, paving the way for magnetic lattice imaging of antiferromagnetic materials and devices.

Original languageEnglish
Pages (from-to)466-472
Number of pages7
JournalScience Bulletin
Volume69
Issue number4
DOIs
StatePublished - 26 Feb 2024
Externally publishedYes

Keywords

  • Antiferromagnetic imaging
  • Electron microscopy
  • Magnetic lattice
  • Ptychography

Fingerprint

Dive into the research topics of 'Antiferromagnetic imaging via ptychographic phase retrieval'. Together they form a unique fingerprint.

Cite this