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Analysis of the throughput of onboard polarization interference imaging spectrometer

  • Chunmin Zhang*
  • , Baochang Zhao
  • , Yan Yuan
  • , Jian He
  • *Corresponding author for this work
  • Xi'an Jiaotong University
  • CAS - Xi'an Institute of Optics and Precision Mechanics

Research output: Contribution to journalConference articlepeer-review

Abstract

The mechanism of beam shearing splitting and principle of the interfering imaging of the self-developed onboard Polarization Interference Imaging Spectrometer (PUS) were expounded in this paper. The throughput of PIIS is analyzed. The relation of the throughput with the angle of the polarized orientation of the polarizer to the ideal direction is derived. This Polarization Interference Imaging Spectrometer has the merit of simple structure, no moving parts, and high throughput. Because of its unique advantage of static, compact in size, wide field of view, it is applicable for the aviation, spaceflight, remote sensing, fieldwork or weak signal detection.

Original languageEnglish
Article number60320T
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume6032
DOIs
StatePublished - 2006
Externally publishedYes
EventICO20: MEMS, MOEMS, and NEMS - Changchun, China
Duration: 21 Aug 200526 Aug 2005

Keywords

  • High throughput
  • Onboard Polarization Interference Imaging Spectrometer
  • Polarized Orientation
  • Static
  • Wide field of View

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