Skip to main navigation Skip to search Skip to main content

Analog circuits fault diagnosis based on serial support vector multi-classifier

  • Jiuqing Wan*
  • , Xingshan Li
  • *Corresponding author for this work
  • Beihang University

Research output: Contribution to journalArticlepeer-review

Abstract

A support vector multiclassification methodology was proposed. Several binary support vector binary classifiers, each of which equipped with a feature extractor based on kernel principle components analysis, were organized in a serial structure. Its training process and classification algorithm were described. The BP net classifier, RBF net classifier, traditional support vector multi-classifier and serial support vector multi-classifier (SSVC) were used for analog circuit fault diagnosis. Compared with BP net and RBF net classifiers, support vector approach has significantly better classification accuracy on test patterns. The SSVC affords top diagnosis accuracy among these classifiers and outperforms traditional support vector multi-calssifier dramatically in training and classification efficiency.

Original languageEnglish
Pages (from-to)789-792
Number of pages4
JournalBeijing Hangkong Hangtian Daxue Xuebao/Journal of Beijing University of Aeronautics and Astronautics
Volume29
Issue number9
StatePublished - Sep 2003

Keywords

  • Analog circuit
  • Fault detection
  • Pattern recognition

Fingerprint

Dive into the research topics of 'Analog circuits fault diagnosis based on serial support vector multi-classifier'. Together they form a unique fingerprint.

Cite this