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An Operator-Circuit Co-design Digital SOT-MRAM Computing-in-Memory Accelerator with Double Bit Density and Full-Utilized Bandwidth/Throughput

  • Tianshuo Bai
  • , Jingcheng Gu
  • , Lehao Tan
  • , Wente Yi
  • , Haolin Ge
  • , Han Zhang
  • , Zhenyu Xue
  • , He Zhang
  • , Na Lei
  • , Biao Pan*
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Computing-in-Memory (CIM) demonstrates exceptional performance on edge AI applications, owing to its in-situ computation capability with minimal data transfer consumption. However, volatile CIMs suffer from inevitable data retention power overhead, while non-volatile MRAM-CIMs still necessitate periodic weight updates constrained by limited memory space, diminishing the intrinsic advantage of CIMs. In this work, we propose a digital SOT-MRAM CIM accelerator with circuit-architecture-operator cross-layer design, achieving double bit density and full utilization of both data transmission bandwidth and computing throughput, thereby satisfying the stringent hardware demands for edge AI applications. Firstly, we propose a refined 2T-1MTJ non-complementary memory cell with an XOR-integrated pre-charged sense amplifier (X-SA), which significantly promotes the storage density and consumes only 6.284 fJ per read-based XOR operation. Then, we devise a channel-flatten data mapping (CFDM) scheme and an operator-aware residual fusion (OARF) structure to full utilize the storage and computing resources. Furthermore, an operator fusion method towards non-linear layers is proposed, achieving an 89.84% size reduction in non-binary parameters. System-level simulations at 40nm demonstrate that our work achieves 284.25 TOPS/W energy efficiency and 5.41 TOPS/mm2 area efficiency with an accuracy of 98.72% (87.78%) on MNIST (CIFAR-10) dataset.

Original languageEnglish
Title of host publication2026 Design, Automation and Test in Europe Conference, DATE 2026 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9783982674117
DOIs
StatePublished - 2026
Event2026 Design, Automation and Test in Europe Conference, DATE 2026 - Verona, Italy
Duration: 20 Apr 202622 Apr 2026

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Conference

Conference2026 Design, Automation and Test in Europe Conference, DATE 2026
Country/TerritoryItaly
CityVerona
Period20/04/2622/04/26

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

Keywords

  • Digital Computing-in-Memory
  • Hardware-Software Co-design
  • Non-Complementary 2T-1MTJ Bit Cell
  • Quantization and Optimization
  • SOT-MRAM

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