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An Improved ICP Point Cloud Registration Method Based on PCA and Point Normal

  • Tong Liu
  • , Can Hao
  • , Chao Gao
  • , Peiling Cui
  • , Weihu Zhou*
  • *Corresponding author for this work
  • Beihang University
  • CAS - Institute of Microelectronics
  • University of Chinese Academy of Sciences

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Point cloud registration addresses the issue of incomplete point clouds caused by occlusion in industrial precision measurement. Improving the registration efficiency and accuracy is an important task. In this paper, we propose an improved ICP registration method based on PCA and point normal. First, the three principal directions of the point cloud are calculated by PCA method, to get the possible transformations. Then the similarity between the registration and the reference point cloud by each possible transformation is calculated, and the one with the highest similarity is selected as the initial transformation. At last, the fine registration is realized by using the nearest distance and point normal constraint ICP together. The registration experiments were carried out on both the public datasets and the real captured point cloud. Compared with another three methods, the results demonstrate our method’s efficiency and accuracy.

Original languageEnglish
Title of host publicationACMLC 2025 - Proceedings of 2025 7th Asia Conference on Machine Learning and Computing
PublisherAssociation for Computing Machinery, Inc
Pages105-110
Number of pages6
ISBN (Electronic)9798400718816
DOIs
StatePublished - 16 Mar 2026
Event2025 7th Asia Conference on Machine Learning and Computing, ACMLC 2025 - Hong Kong, China
Duration: 25 Jul 202527 Jul 2025

Publication series

NameACMLC 2025 - Proceedings of 2025 7th Asia Conference on Machine Learning and Computing

Conference

Conference2025 7th Asia Conference on Machine Learning and Computing, ACMLC 2025
Country/TerritoryChina
CityHong Kong
Period25/07/2527/07/25

Keywords

  • Industrial precise measurement
  • PCA based registration
  • normal constraint ICP registration
  • point cloud similarity

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