An Improved Active Gate Drive Method for SiC MOSFET Better Switching Performance

  • Congwenm Xu
  • , Qishuang Ma
  • , Ping Xu
  • , Tongkai Cui
  • , Poming Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper proposes an improved new SiC MOSFET gate drive method to reduce overshoots in current and voltage, EMI (electromagnetic interference), and switching oscillations. Compared with Si MOSFET, SiC MOSFETs can work under higher switching speed and higher supply voltage, which results in stronger oscillations, EMI and more losses. Therefore, reducing the switching oscillation and studying the switching loss is an important research direction in the field of power electronics. The theoretical derivation of the causes of oscillations was given and lists the oscillation equations in this paper. In addition, it is proposed to control the switching oscillation and the switching loss by increasing the gate resistance during the Miller platform. Considering that the oscillation of the gate voltage has an important influence on the switching of the gate resistance, the oscillation equation of the gate voltage is studied carefully. On the other hand, the feedback part of the gate voltage is added to suppress the gate oscillation and the output oscillation to some extent. Finally, the circuit element parameters were optimized to get better simulation results with Pspice compared with the traditional hard switching.

Original languageEnglish
Title of host publicationProceedings of 2018 IEEE 3rd Advanced Information Technology, Electronic and Automation Control Conference, IAEAC 2018
EditorsBing Xu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1114-1119
Number of pages6
ISBN (Electronic)9781538645086
DOIs
StatePublished - 14 Dec 2018
Event3rd IEEE Advanced Information Technology, Electronic and Automation Control Conference, IAEAC 2018 - Chongqing, China
Duration: 12 Oct 201814 Oct 2018

Publication series

NameProceedings of 2018 IEEE 3rd Advanced Information Technology, Electronic and Automation Control Conference, IAEAC 2018

Conference

Conference3rd IEEE Advanced Information Technology, Electronic and Automation Control Conference, IAEAC 2018
Country/TerritoryChina
CityChongqing
Period12/10/1814/10/18

Keywords

  • Active gate drive
  • EMI
  • SiC MOSFET
  • Switching loss
  • Switching oscillation

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