An empirical approach to develop near-field limit for radiated-emission compliance check

Kye Yak See; Ning Fang; Lin Biao Wang; Weishan Soh; Tengiz Svimonishvili; Manish Oswal; Weng Yew Chang; Wee Jin Koh

doi:10.1109/TEMC.2014.2302003

An empirical approach to develop near-field limit for radiated-emission compliance check

Kye Yak See
, Ning Fang
, Lin Biao Wang
, Weishan Soh
, Tengiz Svimonishvili
, Manish Oswal
, Weng Yew Chang
, Wee Jin Koh

School of Electronic and Information Engineering

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

Based on measurements from a near-field scanner and far-field measurements obtained in a semi-anechoic chamber, a statistical relationship is established between a magnetic field in the near field and an electric field in the far field. The relationship makes it possible to transform a radiated-emission regulatory limit from the far-field to the near-field zone. The transformed near-field limit can allow efficient prediction of radiated-emission compliance for high-speed printed circuit boards. The presented results demonstrate the feasibility of the proposed method for a quick radiated-emission precompliance check without heavy equipment investment.

Original language	English
Article number	6736056
Pages (from-to)	691-698
Number of pages	8
Journal	IEEE Transactions on Electromagnetic Compatibility
Volume	56
Issue number	3
DOIs	https://doi.org/10.1109/TEMC.2014.2302003
State	Published - Jun 2014

Keywords

Electromagnetic compatibility (EMC)
empirical approach
far-field (FF)-to-near-field (NF) limit transformation
radiated emissions

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10.1109/TEMC.2014.2302003

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@article{a0185825dc994c06a578ced58cbbc9bc,

title = "An empirical approach to develop near-field limit for radiated-emission compliance check",

abstract = "Based on measurements from a near-field scanner and far-field measurements obtained in a semi-anechoic chamber, a statistical relationship is established between a magnetic field in the near field and an electric field in the far field. The relationship makes it possible to transform a radiated-emission regulatory limit from the far-field to the near-field zone. The transformed near-field limit can allow efficient prediction of radiated-emission compliance for high-speed printed circuit boards. The presented results demonstrate the feasibility of the proposed method for a quick radiated-emission precompliance check without heavy equipment investment.",

keywords = "Electromagnetic compatibility (EMC), empirical approach, far-field (FF)-to-near-field (NF) limit transformation, radiated emissions",

author = "See, \{Kye Yak\} and Ning Fang and Wang, \{Lin Biao\} and Weishan Soh and Tengiz Svimonishvili and Manish Oswal and Chang, \{Weng Yew\} and Koh, \{Wee Jin\}",

year = "2014",

month = jun,

doi = "10.1109/TEMC.2014.2302003",

language = "英语",

volume = "56",

pages = "691--698",

journal = "IEEE Transactions on Electromagnetic Compatibility",

issn = "0018-9375",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "3",

}

TY - JOUR

T1 - An empirical approach to develop near-field limit for radiated-emission compliance check

AU - See, Kye Yak

AU - Fang, Ning

AU - Wang, Lin Biao

AU - Soh, Weishan

AU - Svimonishvili, Tengiz

AU - Oswal, Manish

AU - Chang, Weng Yew

AU - Koh, Wee Jin

PY - 2014/6

Y1 - 2014/6

N2 - Based on measurements from a near-field scanner and far-field measurements obtained in a semi-anechoic chamber, a statistical relationship is established between a magnetic field in the near field and an electric field in the far field. The relationship makes it possible to transform a radiated-emission regulatory limit from the far-field to the near-field zone. The transformed near-field limit can allow efficient prediction of radiated-emission compliance for high-speed printed circuit boards. The presented results demonstrate the feasibility of the proposed method for a quick radiated-emission precompliance check without heavy equipment investment.

AB - Based on measurements from a near-field scanner and far-field measurements obtained in a semi-anechoic chamber, a statistical relationship is established between a magnetic field in the near field and an electric field in the far field. The relationship makes it possible to transform a radiated-emission regulatory limit from the far-field to the near-field zone. The transformed near-field limit can allow efficient prediction of radiated-emission compliance for high-speed printed circuit boards. The presented results demonstrate the feasibility of the proposed method for a quick radiated-emission precompliance check without heavy equipment investment.

KW - Electromagnetic compatibility (EMC)

KW - empirical approach

KW - far-field (FF)-to-near-field (NF) limit transformation

KW - radiated emissions

UR - https://www.scopus.com/pages/publications/84901481870

U2 - 10.1109/TEMC.2014.2302003

DO - 10.1109/TEMC.2014.2302003

M3 - 文章

AN - SCOPUS:84901481870

SN - 0018-9375

VL - 56

SP - 691

EP - 698

JO - IEEE Transactions on Electromagnetic Compatibility

JF - IEEE Transactions on Electromagnetic Compatibility

IS - 3

M1 - 6736056

ER -

An empirical approach to develop near-field limit for radiated-emission compliance check

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Keywords

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