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An E-Band Frequency Quadrupler With Temperature Compensation Technique in 28-nm Bulk CMOS

  • Changwei Wang
  • , Biao Deng
  • , Mingjie Liu
  • , Yan Wang
  • , Dongfang Pan*
  • , Liguo Sun*
  • *Corresponding author for this work
  • University of Science and Technology of China
  • Hefei University

Research output: Contribution to journalArticlepeer-review

Abstract

This letter presents an E-band frequency quadrupler (FQ) implemented in 28-nm CMOS, featuring advanced temperature compensation to ensure consistent performance across a wide range of temperatures. The design employs dynamic adjustment of the push–push (PP) core’s transconductance (gm) and the injection-locked (IL) core’s variable capacitance, achieving stable output power and frequency from −45 ◦C to 125 ◦C. By combining PP and IL architectures, the quadrupler achieves high efficiency (η) and power-added efficiency (PAE) with a small core area of 345 × 270 µm2 . The measurement results demonstrate a 94% reduction in conversion gain (CG) variation, from 8.10 to 0.53 dB, and a peak CG of 4.58 dB at 80.9 GHz.

Original languageEnglish
Pages (from-to)1811-1814
Number of pages4
JournalIEEE Microwave and Wireless Technology Letters
Volume35
Issue number11
DOIs
StatePublished - Nov 2025
Externally publishedYes

Keywords

  • CMOS
  • E band
  • frequency quadrupler (FQ)
  • injection locked (IL)
  • temperature compensation

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