Abstract
This letter presents an E-band frequency quadrupler (FQ) implemented in 28-nm CMOS, featuring advanced temperature compensation to ensure consistent performance across a wide range of temperatures. The design employs dynamic adjustment of the push–push (PP) core’s transconductance (gm) and the injection-locked (IL) core’s variable capacitance, achieving stable output power and frequency from −45 ◦C to 125 ◦C. By combining PP and IL architectures, the quadrupler achieves high efficiency (η) and power-added efficiency (PAE) with a small core area of 345 × 270 µm2 . The measurement results demonstrate a 94% reduction in conversion gain (CG) variation, from 8.10 to 0.53 dB, and a peak CG of 4.58 dB at 80.9 GHz.
| Original language | English |
|---|---|
| Pages (from-to) | 1811-1814 |
| Number of pages | 4 |
| Journal | IEEE Microwave and Wireless Technology Letters |
| Volume | 35 |
| Issue number | 11 |
| DOIs | |
| State | Published - Nov 2025 |
| Externally published | Yes |
Keywords
- CMOS
- E band
- frequency quadrupler (FQ)
- injection locked (IL)
- temperature compensation
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