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An ARL-unbiased design of Gamma control chart

  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Gamma charts based on time-between-events (TBE) data are very useful for process monitoring in the manufacturing industry. The average run length (ARL) is widely adopted as a criterion to evaluate the performance of Gamma charts. The traditional equal-tail probability limits are often used to provide the control limits of Gamma charts, however their ARL curves will not approach their maximum values at their in-control occurrence rates. To overcome the above problem, an ARL-unbiased design for Gamma charts with known parameters is proposed. The comparison result shows that the ARL-unbiased Gamma control charts are more sensitive to systematic deterioration than the traditional charts with the equal-tail probability limits. Finally, a real example is illustrated to demonstrate the implementation of the proposed approach.

Original languageEnglish
Title of host publicationProceedings of 2015 the 1st International Conference on Reliability Systems Engineering, ICRSE 2015
EditorsShunong Zhang, Zili Wang
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467385565
DOIs
StatePublished - 24 Dec 2015
Event1st International Conference on Reliability Systems Engineering, ICRSE 2015 - Beijing, China
Duration: 21 Oct 201523 Oct 2015

Publication series

NameProceedings of 2015 the 1st International Conference on Reliability Systems Engineering, ICRSE 2015

Conference

Conference1st International Conference on Reliability Systems Engineering, ICRSE 2015
Country/TerritoryChina
CityBeijing
Period21/10/1523/10/15

Keywords

  • ARL-unbiased design
  • Chi-square distribution
  • Gamma distribution
  • Time between events
  • average run length (ARL)

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