@inproceedings{1a7bca637d524197bb00078590a6d564,
title = "An ADT comprehensive evaluation method based on Bayesian",
abstract = "Accelerated degradation testing (ADT) is used to obtain performance parameter in a short time and extrapolate the lifetime and reliability of the products under normal operation conditions. However, sometimes the degradation information from ADT is not enough for the limited cost and time, and the evaluation accuracy of the lifetime and reliability would be low for it. To solve this problem, this paper presents an ADT comprehensive evaluation method based on Bayesian theory, and take super luminescent diode (SLD) as an example to explain the application of this method.",
keywords = "Accelerated degradation testing, Bayesian, Comprehensive evaluation, Reliability, SLD",
author = "Lizhi Wang and Tongmin Jiang and Xiaoyang Li and Jingrui Zhang",
year = "2010",
doi = "10.1109/IEEM.2010.5674568",
language = "英语",
isbn = "9781424485031",
series = "IEEM2010 - IEEE International Conference on Industrial Engineering and Engineering Management",
pages = "1761--1765",
booktitle = "IEEM2010 - IEEE International Conference on Industrial Engineering and Engineering Management",
note = "IEEE International Conference on Industrial Engineering and Engineering Management, IEEM2010 ; Conference date: 07-12-2010 Through 10-12-2010",
}