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An adaptive fringe projection method for measuring three-dimensional profile of surface with high reflectivity using sub-pixel coordinate mapping

  • Qiongyi Zhang
  • , Junhua Sun*
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Fringe projection profilometry (FPP) is a popular three-dimensional (3D) shape measurement technique and has been widely used in industry. However, measuring surface with high reflectivity is still challenging because image saturation leads to absolute phase errors and reconstruction errors. In this paper, a novel adaptive fringe projection method is proposed. First, a projection intensity model is built. Adjusting the exposure time only once can easily calculate the low projection intensity. Then, using fringe patterns with low intensity we can get the coordinate mapping relationship. By mapping and filtering the sub-pixel coordinates in the projector image, we can obtain more accurate coordinate correspondence and gray value correspondence of the projector and the camera. Finally, the parameters of the projection intensity model are fitted to calculate the optimal intensity and generate accurate adaptive fringe patterns. The measurement experiments demonstrate that the proposed method is effective in obtaining high-precision and complete 3D profile of surface with high reflectivity.

Original languageEnglish
Title of host publicationAOPC 2021
Subtitle of host publicationInfrared Device and Infrared Technology
EditorsHaiMei Gong, Zelin Shi, Jin Lu
PublisherSPIE
ISBN (Electronic)9781510649972
DOIs
StatePublished - 2021
Event2021 Applied Optics and Photonics China: Infrared Device and Infrared Technology, AOPC 2021 - Beijing, China
Duration: 20 Jun 202122 Jun 2021

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12061
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2021 Applied Optics and Photonics China: Infrared Device and Infrared Technology, AOPC 2021
Country/TerritoryChina
CityBeijing
Period20/06/2122/06/21

Keywords

  • Adaptive fringe projection
  • Fringe projection profilometry
  • Sub-pixel coordinate mapping
  • Surface with high reflectivity
  • Three-dimensional shape measurement

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