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An adaptive fault detection threshold hardware circuit design to reduce False Alarms

  • Y. Cui
  • , J. Shi
  • , L. Chen
  • , K. Liu
  • , W. An
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Built-In Tests (BITs), responsible for detecting and isolating faults, are widely used in mechanical and electronic products to improve reliability and testability. However, the False Alarm (FA) phenomenon greatly reduces the BIT accuracy and credibility, which becomes one of the most troublesome problem in BIT applications. Compared with the single-threshold fault detection method, an adaptive and automatically adjustable threshold for determining the current state would better to reduce false alarms. In this paper, an adaptive fault detection threshold hardware circuit is designed and tested. The concept of the adaptive fault detection threshold strategy is introduced at the beginning. The outlines and details of circuit design implementations are also discussed, including the function requirements, input/output specifications, and implementation tools. Finally, a hardware BIT circuit board monitoring a typical fault mode is made out, and a performance analysis of the hardware design is carried out.

Original languageEnglish
Title of host publicationSafety and Reliability
Subtitle of host publicationMethodology and Applications - Proceedings of the European Safety and Reliability Conference, ESREL 2014
PublisherCRC Press/Balkema
Pages867-872
Number of pages6
ISBN (Print)9781138026810
DOIs
StatePublished - 2015
EventEuropean Safety and Reliability Conference, ESREL 2014 - Wroclaw, Poland
Duration: 14 Sep 201418 Sep 2014

Publication series

NameSafety and Reliability: Methodology and Applications - Proceedings of the European Safety and Reliability Conference, ESREL 2014

Conference

ConferenceEuropean Safety and Reliability Conference, ESREL 2014
Country/TerritoryPoland
CityWroclaw
Period14/09/1418/09/14

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