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An adaptive fault detection threshold hardware circuit design to reduce False Alarms

  • Y. Cui
  • , J. Shi
  • , L. Chen
  • , K. Liu
  • , W. An
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Abstract

Built-In Tests (BITs), responsible for detecting and isolating faults, are widely used in mechanical and electronic products to improve reliability and testability. However, the False Alarm (FA) phenomenon greatly reduces the BIT accuracy and credibility, which becomes one of the most troublesome problem in BIT applications. Compared with the single-threshold fault detection method, an adaptive and automatically adjustable threshold for determining the current state would better to reduce false alarms. In this paper, an adaptive fault detection threshold hardware circuit is designed and tested. The concept of the adaptive fault detection threshold strategy is introduced at the beginning. The outlines and details of circuit design implementations are also discussed, including the function requirements, input/output specifications, and implementation tools. Finally, a hardware BIT circuit board monitoring a typical fault mode is made out, and a performance analysis of the hardware design is carried out.

Original languageEnglish
Title of host publicationSafety and Reliability
Subtitle of host publicationMethodology and Applications
PublisherCRC Press
Pages867-872
Number of pages6
ISBN (Electronic)9781315736976
ISBN (Print)9781138026810
DOIs
StatePublished - 1 Jan 2014

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