An Active Junction Temperature Control Method Based on Thermoelectric Coolers

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Thermal stress caused by junction temperature fluctuations is one of the main factors reducing the reliability of the power semiconductor devices. Hence, in order to reduce the severe junction temperature fluctuation, this paper proposed a novel active junction temperature control method based on thermoelectric coolers (TEC). Firstly, the thermal model of the inverter-TEC system was established. Secondly, a hysteresis loop junction temperature control method was proposed. Then, TEC power consumption and the efficiency of the inverter-TEC system were analyzed. Finally, a simulation was implemented and results verified the proposed method. The maximum junction temperature fluctuation is reduced significantly by 65.4% in Urban Dynamometer Driving Schedule (UDDS) condition. Meanwhile, the average junction temperature is dropped by 5.96%. Therefore, the lifetime of power devices can be extended.

Original languageEnglish
Title of host publicationECCE 2020 - IEEE Energy Conversion Congress and Exposition
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages3306-3311
Number of pages6
ISBN (Electronic)9781728158266
DOIs
StatePublished - 11 Oct 2020
Event12th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2020 - Virtual, Detroit, United States
Duration: 11 Oct 202015 Oct 2020

Publication series

NameECCE 2020 - IEEE Energy Conversion Congress and Exposition

Conference

Conference12th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2020
Country/TerritoryUnited States
CityVirtual, Detroit
Period11/10/2015/10/20

Keywords

  • efficiency
  • junction temperature control
  • power device
  • reliability
  • thermoelectric coolers

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