TY - GEN
T1 - An Active Junction Temperature Control Method Based on Thermoelectric Coolers
AU - Ding, Xiaofeng
AU - Song, Xinrong
AU - Shan, Zhenyu
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/10/11
Y1 - 2020/10/11
N2 - Thermal stress caused by junction temperature fluctuations is one of the main factors reducing the reliability of the power semiconductor devices. Hence, in order to reduce the severe junction temperature fluctuation, this paper proposed a novel active junction temperature control method based on thermoelectric coolers (TEC). Firstly, the thermal model of the inverter-TEC system was established. Secondly, a hysteresis loop junction temperature control method was proposed. Then, TEC power consumption and the efficiency of the inverter-TEC system were analyzed. Finally, a simulation was implemented and results verified the proposed method. The maximum junction temperature fluctuation is reduced significantly by 65.4% in Urban Dynamometer Driving Schedule (UDDS) condition. Meanwhile, the average junction temperature is dropped by 5.96%. Therefore, the lifetime of power devices can be extended.
AB - Thermal stress caused by junction temperature fluctuations is one of the main factors reducing the reliability of the power semiconductor devices. Hence, in order to reduce the severe junction temperature fluctuation, this paper proposed a novel active junction temperature control method based on thermoelectric coolers (TEC). Firstly, the thermal model of the inverter-TEC system was established. Secondly, a hysteresis loop junction temperature control method was proposed. Then, TEC power consumption and the efficiency of the inverter-TEC system were analyzed. Finally, a simulation was implemented and results verified the proposed method. The maximum junction temperature fluctuation is reduced significantly by 65.4% in Urban Dynamometer Driving Schedule (UDDS) condition. Meanwhile, the average junction temperature is dropped by 5.96%. Therefore, the lifetime of power devices can be extended.
KW - efficiency
KW - junction temperature control
KW - power device
KW - reliability
KW - thermoelectric coolers
UR - https://www.scopus.com/pages/publications/85097153447
U2 - 10.1109/ECCE44975.2020.9236424
DO - 10.1109/ECCE44975.2020.9236424
M3 - 会议稿件
AN - SCOPUS:85097153447
T3 - ECCE 2020 - IEEE Energy Conversion Congress and Exposition
SP - 3306
EP - 3311
BT - ECCE 2020 - IEEE Energy Conversion Congress and Exposition
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 12th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2020
Y2 - 11 October 2020 through 15 October 2020
ER -