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Amorphous phase stability of NbTiAlSiNX high-entropy films

  • Wen Jie Sheng
  • , Xiao Yang
  • , Jie Zhu
  • , Cong Wang
  • , Yong Zhang*
  • *Corresponding author for this work
  • University of Science and Technology Beijing

Research output: Contribution to journalArticlepeer-review

Abstract

In this study, high-entropy films with the composition of NbTiAlSiNX were prepared by a reactive direct current (DC) magnetron sputtering technique, with different nitrogen flow rates (0, 4 and 8 ml·min−1). The microstructures and properties were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), high-resolution transmission electron microscopy (HRTEM), nano-indenter and spectrophotometer. All of the as-deposited NbTiAlSiNX films are shown to have an amorphous structure, and the films exhibit high thermal stability up to 700 °C. The maximum hardness and modulus values of the films reach 20.5 GPa (4 ml·min−1) and 206.8 GPa (0 ml·min−1), respectively. The films exhibit high absorption of the solar energy in the wavelength of 0.3–2.5 μm, which indicates that NbTiAlSiNX nitride film is a potential candidate solar selective absorbing coating for high-temperature photo-thermal conversion in the concentrated solar power project.

Original languageEnglish
Pages (from-to)682-689
Number of pages8
JournalRare Metals
Volume37
Issue number8
DOIs
StatePublished - 1 Aug 2018

Keywords

  • Amorphous
  • High-entropy film
  • Phase stability
  • Photo-thermal conversion
  • Sputtering

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