Accelerated testing of equipment based on the duane model

In most cases, the accelerated life tests aim at only one failure mode and failure mechanism and are applied to circuit boards or unit-level products for the most part. As for complex equipment it's difficult to choose reasonable accelerate stress and accurate model, which influences the research and application of accelerated testing on equipment-level products. We introduce a new method based on the theory of reliability growth testing. By using the Duane model, the results of step-down-stress accelerated life test were evaluated and the reliability under normal stress was extrapolated. Finally, the result of the proposed method was verified through simulation.