TY - GEN
T1 - Accelerated lifetime test for isolated components in linear drivers of high-voltage LED system
AU - Sun, Bo
AU - Koh, Sau Wee
AU - Yuan, Cadmus
AU - Fan, Xuejun
AU - Zhang, Guoqi
PY - 2013
Y1 - 2013
N2 - This paper proposes an isolated component accelerated lifetime testing of high-voltage SSL driver. In this method, the most critical component(s) will be isolated from the rest, and critical stress will be applied to these components to estimate the lifetime. Although circuit modification is unavoidable, this testing method can minimize failure interactions between components and testing duration for the system. Thus, compared to the conventional accelerated testing method, this method could achieve shorter test duration. In the configuration of high-voltage LED, the electrolytic capacitors have been selected from the linear driver configuration. As one of most significant failure mechanisms, the effects of high temperature degradation of electrolytic capacitors to the entire system were investigated in this test. To quantify these effects, the changes in luminous flux and power consumption over time were measured. By analysis of all these output data, the relationship between the system's outputs and temperature of electrolytic capacitor can be found. For the high-voltage LED system, this relationship is a required condition for the accurate system reliability prediction.
AB - This paper proposes an isolated component accelerated lifetime testing of high-voltage SSL driver. In this method, the most critical component(s) will be isolated from the rest, and critical stress will be applied to these components to estimate the lifetime. Although circuit modification is unavoidable, this testing method can minimize failure interactions between components and testing duration for the system. Thus, compared to the conventional accelerated testing method, this method could achieve shorter test duration. In the configuration of high-voltage LED, the electrolytic capacitors have been selected from the linear driver configuration. As one of most significant failure mechanisms, the effects of high temperature degradation of electrolytic capacitors to the entire system were investigated in this test. To quantify these effects, the changes in luminous flux and power consumption over time were measured. By analysis of all these output data, the relationship between the system's outputs and temperature of electrolytic capacitor can be found. For the high-voltage LED system, this relationship is a required condition for the accurate system reliability prediction.
KW - Accelerated lifetime test
KW - Solid State Lighting
KW - electrolytic capacitor
KW - high-voltage LED
KW - linear driver
UR - https://www.scopus.com/pages/publications/84880976237
U2 - 10.1109/EuroSimE.2013.6529911
DO - 10.1109/EuroSimE.2013.6529911
M3 - 会议稿件
AN - SCOPUS:84880976237
SN - 9781467361385
T3 - 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013
BT - 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013
PB - IEEE Computer Society
T2 - 2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2013
Y2 - 14 April 2013 through 17 April 2013
ER -