@inproceedings{1b97041466744dc694eaffd7b5296ae4,
title = "Accelerated Degradation Testing Optimal Design Based on Uncertain Process",
abstract = "For long lifetime and highly reliable products with few samples, how to design an efficient step-stress accelerated degradation testing (SSADT) plan is still an urgent problem to be solved. In such a case, an uncertain process is applied to describe the performance degradation process of products. In this paper, an optimal problem is established for an SSADT which the objective is minimizing the square of the distance between test data and uncertain distribution based on the least-squares method. Under the limited budget, optimal variables are determined such as stress levels, the monitoring time and testing sample sizes. Finally, a simulation case is constructed to illustrate the effectiveness of the proposed optimization method.",
keywords = "Accelerated degradation testing (ADT), Least square method, Optimal design, Uncertain process",
author = "Guo, \{Zuo Chen\} and Li, \{Xiao Yang\} and Chen, \{Wen Bin\}",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 12th International Conference on Reliability, Maintainability, and Safety, ICRMS 2018 ; Conference date: 17-10-2018 Through 19-10-2018",
year = "2018",
month = jul,
day = "2",
doi = "10.1109/ICRMS.2018.00054",
language = "英语",
series = "Proceedings - 12th International Conference on Reliability, Maintainability, and Safety, ICRMS 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "249--253",
booktitle = "Proceedings - 12th International Conference on Reliability, Maintainability, and Safety, ICRMS 2018",
address = "美国",
}