TY - GEN
T1 - Accelerated degradation testing of coating of PCB under humid heat env
AU - Ren, Xiaoming
AU - Wang, Xiaohui
AU - Zhu, Run
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/5/8
Y1 - 2015/5/8
N2 - Printed circuit board (PCB) is the carrier of electronic components. Its coating is the first barrier for protecting itself. If the coating is damaged, the performance of printed circuit board will decrease rapidly until failure. Therefore, the coating plays an important role to the entire printed circuit board. In this paper, we designed an accelerated degradation test under humid heat environment for a typical kind of coating (Parylene C). And chose insulation resistance, moisture absorption and surface morphology as its test ind exes. At last, we estimate the coating's failure time based on the degradation of insulation resistance.
AB - Printed circuit board (PCB) is the carrier of electronic components. Its coating is the first barrier for protecting itself. If the coating is damaged, the performance of printed circuit board will decrease rapidly until failure. Therefore, the coating plays an important role to the entire printed circuit board. In this paper, we designed an accelerated degradation test under humid heat environment for a typical kind of coating (Parylene C). And chose insulation resistance, moisture absorption and surface morphology as its test ind exes. At last, we estimate the coating's failure time based on the degradation of insulation resistance.
KW - Accelerated degradation testing
KW - failure time
KW - humid heat environment
KW - Parylene C
UR - https://www.scopus.com/pages/publications/84945374807
U2 - 10.1109/RAMS.2015.7105094
DO - 10.1109/RAMS.2015.7105094
M3 - 会议稿件
AN - SCOPUS:84945374807
T3 - Proceedings - Annual Reliability and Maintainability Symposium
BT - RAMS 2015 - 61st Annual Reliability and Maintainability Symposium, Proceedings and Tutorials 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 61st Annual Reliability and Maintainability Symposium, RAMS 2015
Y2 - 26 January 2015 through 29 January 2015
ER -