Accelerated degradation mechanism modeling method for accelerometers

To deal with the difficulties of lacking mechanism model for traditional accelerated degradation test design, a modeling method was proposed based on main mechanism test, key part simulation, parameters analysis and system identification. The main mechanism was identified and its test was carried out next. The key output parameters were obtained through finite element analysis. Then the relationship between key output parameters and product performance parameters was gained by parameters analysis. Finally, the accelerated degradation mechanism model was got through system identification. Taking account of the accelerometer, the accelerated degradation mechanism model and the results of scaling factor stability analysis at constant temperature were given. The conclusion of comparing the model results with historical data at constant temperature proved that the method is feasible.