TY - GEN
T1 - A Unified Power-Based Model for RFI Demodulation in CMOS Operational Amplifiers
AU - Cui, Yutong
AU - Jin, Yuntao
AU - Wang, Sen
AU - Dai, Fei
N1 - Publisher Copyright:
© 2025 Applied Computational Electromagnetics Society.
PY - 2025
Y1 - 2025
N2 - The DC offset induced by Radio-Frequency Interference (RFI) in operational amplifiers is a well-known effect, though it is typically characterized using simple continuous-wave (CW) signals. This paper extends the analysis of this phenomenon to generalized complex modulated signals. Through theoretical derivation and experimental validation, we demonstrate that the resulting DC offset is governed solely by the total root-mean-square (RMS) power of the interfering signal, independent of its specific modulation. To prove this, we employed the Direct Power Injection (DPI) method to compare the effects of CW and frequency-modulated (FM) signals with identical RMS power. The results show that both signals produce a nearly identical DC offset. This finding confirms that the response of an op-amp to complex modulated RFI can be accurately predicted using standard CW test data, thereby simplifying susceptibility analysis for high-precision analog circuits.
AB - The DC offset induced by Radio-Frequency Interference (RFI) in operational amplifiers is a well-known effect, though it is typically characterized using simple continuous-wave (CW) signals. This paper extends the analysis of this phenomenon to generalized complex modulated signals. Through theoretical derivation and experimental validation, we demonstrate that the resulting DC offset is governed solely by the total root-mean-square (RMS) power of the interfering signal, independent of its specific modulation. To prove this, we employed the Direct Power Injection (DPI) method to compare the effects of CW and frequency-modulated (FM) signals with identical RMS power. The results show that both signals produce a nearly identical DC offset. This finding confirms that the response of an op-amp to complex modulated RFI can be accurately predicted using standard CW test data, thereby simplifying susceptibility analysis for high-precision analog circuits.
KW - DC offset
KW - Direct Power Injection (DPI)
KW - Electromagnetic Compatibility (EMC)
KW - Operational amplifiers
KW - Radio-Frequency Interference (RFI)
KW - Susceptibility
UR - https://www.scopus.com/pages/publications/105034696020
U2 - 10.23919/ACES-China66523.2025.11332861
DO - 10.23919/ACES-China66523.2025.11332861
M3 - 会议稿件
AN - SCOPUS:105034696020
T3 - 2025 International Applied Computational Electromagnetics Society Symposium, ACES-China 2025 - Proceedings
BT - 2025 International Applied Computational Electromagnetics Society Symposium, ACES-China 2025 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2025 International Applied Computational Electromagnetics Society Symposium, ACES-China 2025
Y2 - 8 August 2025 through 11 August 2025
ER -