@inproceedings{df5ce4d447db44459893441073e24de4,
title = "A Testing-Coverage Software Reliability Growth Model Considering the Randomness of the Field Environment",
abstract = "Many studies show that software reliability growth models (SRGMs) have good performance when considering the randomness of the field environments. In this paper, we propose a new software reliability model incorporating S-shaped testing coverage with the randomness of the field environments. Parameters of the new model are estimated by means of the least square estimation (LSE) method. Comparison of this model with other existing NHPP models has also been presented. Five goodness-of-fit criteria are used to compare the performance of the proposed model with several existing NHPP SRGMs based on one actual failure data set collected from software application. The results show that the proposed model can fit significantly better than all other existing NHPP models.",
keywords = "software reliability model, testing coverage, the randomness of the field environment",
author = "Chengyong Mao and Qiuying Li",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 2nd IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2016 ; Conference date: 01-08-2016 Through 03-08-2016",
year = "2016",
month = sep,
day = "21",
doi = "10.1109/QRS-C.2016.62",
language = "英语",
series = "Proceedings - 2016 IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "402--403",
booktitle = "Proceedings - 2016 IEEE International Conference on Software Quality, Reliability and Security-Companion, QRS-C 2016",
address = "美国",
}