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A Test System for Determining the Electromagnetic Spectrum Susceptibility Thresholds of Electronic Information Devices

  • Laibing Feng*
  • , Yaoyao Li
  • , Jun Zhang
  • , Zongqi Hu
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper presents a test system for electromagnetic spectrum susceptibility thresholds of electronic information systems. It enables systematic testing and research on typical devices within electronic information systems to characterize their electromagnetic susceptibility in high-dimensional complex electromagnetic environments. The system provides foundational data for constructing electromagnetic spectrum susceptibility prototypes and predicts susceptibility thresholds, thereby enhancing the electromagnetic safety coefficient of typical equipment.

Original languageEnglish
Title of host publication2025 International Applied Computational Electromagnetics Society Symposium, ACES-China 2025 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781733467711
DOIs
StatePublished - 2025
Event2025 International Applied Computational Electromagnetics Society Symposium, ACES-China 2025 - Huangshan, China
Duration: 8 Aug 202511 Aug 2025

Publication series

Name2025 International Applied Computational Electromagnetics Society Symposium, ACES-China 2025 - Proceedings

Conference

Conference2025 International Applied Computational Electromagnetics Society Symposium, ACES-China 2025
Country/TerritoryChina
CityHuangshan
Period8/08/2511/08/25

Keywords

  • Electromagnetic environment
  • Electromagnetic spectrum
  • Susceptibility thresholds

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