A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers

Bo Sun; Xuejun Fan; Willem Van Driel; Guoqi Zhang

doi:10.1109/EuroSimE.2016.7463387

A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers

Bo Sun
, Xuejun Fan
, Willem Van Driel
, Guoqi Zhang

Delft University of Technology
State Key Laboratory of Solid-State Lighting
Lamar University
Koninklijke Philips N.V.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.

Original language	English
Title of host publication	2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781509021062
DOIs	https://doi.org/10.1109/EuroSimE.2016.7463387
State	Published - 29 Apr 2016
Externally published	Yes
Event	17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016 - Montpellier, France Duration: 18 Apr 2016 → 20 Apr 2016

Publication series

Name	2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016

Conference

Conference	17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016
Country/Territory	France
City	Montpellier
Period	18/04/16 → 20/04/16

Keywords

Electrolytic Capacitor-Free LED Driver
MOSFET
Reliability

Access to Document

10.1109/EuroSimE.2016.7463387

Cite this

Sun, B., Fan, X., Van Driel, W., & Zhang, G. (2016). A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers. In 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016 Article 7463387 (2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EuroSimE.2016.7463387

Sun, Bo ; Fan, Xuejun ; Van Driel, Willem et al. / A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers. 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016. Institute of Electrical and Electronics Engineers Inc., 2016. (2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016).

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title = "A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers",

abstract = "In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.",

keywords = "Electrolytic Capacitor-Free LED Driver, MOSFET, Reliability",

author = "Bo Sun and Xuejun Fan and \{Van Driel\}, Willem and Guoqi Zhang",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016 ; Conference date: 18-04-2016 Through 20-04-2016",

year = "2016",

month = apr,

day = "29",

doi = "10.1109/EuroSimE.2016.7463387",

language = "英语",

series = "2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016",

address = "美国",

}

Sun, B, Fan, X, Van Driel, W & Zhang, G 2016, A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers. in 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016., 7463387, 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016, Institute of Electrical and Electronics Engineers Inc., 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016, Montpellier, France, 18/04/16. https://doi.org/10.1109/EuroSimE.2016.7463387

A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers. / Sun, Bo; Fan, Xuejun; Van Driel, Willem et al.
2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016. Institute of Electrical and Electronics Engineers Inc., 2016. 7463387 (2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers

AU - Sun, Bo

AU - Fan, Xuejun

AU - Van Driel, Willem

AU - Zhang, Guoqi

PY - 2016/4/29

Y1 - 2016/4/29

N2 - In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.

AB - In this paper, a systematic approach for reliability assessment of electrolytic capacitor-free LED drivers is developed to investigate the failure rate of MOSFETs in the drivers. An original fly-back driver with electrolytic capacitor and two modified electrolytic capacitor-free drivers are studied, and their performances are compared. Due to LED lumen depreciation during operation, current of the MOSFET decreases over time, which cancels out the effect of junction temperature increase. As a result, the junction temperature of MOSFET increase mildly for the case study, but failure rate is accelerated.

KW - Electrolytic Capacitor-Free LED Driver

KW - MOSFET

KW - Reliability

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U2 - 10.1109/EuroSimE.2016.7463387

DO - 10.1109/EuroSimE.2016.7463387

M3 - 会议稿件

AN - SCOPUS:84974625058

T3 - 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016

BT - 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016

Y2 - 18 April 2016 through 20 April 2016

ER -

Sun B, Fan X, Van Driel W, Zhang G. A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers. In 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016. Institute of Electrical and Electronics Engineers Inc. 2016. 7463387. (2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2016). doi: 10.1109/EuroSimE.2016.7463387

A systematic approach for reliability assessment of electrolytic capacitor-free LED drivers

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