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A Sub-Sampling Fast Lock Detector for Fractional-N PLL

  • Fanxun Cai
  • , Ziyang Li
  • , Zijie Wang
  • , Yunqi Yang
  • , Pengcheng Wang
  • , Yilin Xu
  • , Lianbo Wu
  • , Hui Zhang
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, a sub-sampling lock detector is proposed to detect the lock or out-of-lock state for fractional-N phase-locked loop (PLL) in various applications, such as the generation of Frequency-Modulated Continuous Wave (FMCW) signal or controlling the loop switching of sub-sampling PLL (SSPLL). The proposed lock detector is designed without powerconsuming analog comparator or switched-capacitor circuits. The proposed detector can detect the lock and out-of-lock state within less than 20 reference clock periods and the total consumption is only 290uW with 80 MHz reference clock in a 40-nm CMOS technology.

Original languageEnglish
Title of host publicationProceedings - 2025 21st IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2025
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798331589073
DOIs
StatePublished - 2025
Event2025 21st IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2025 - Busan, Korea, Republic of
Duration: 12 Oct 202515 Oct 2025

Publication series

NameProceedings - 2025 21st IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2025

Conference

Conference2025 21st IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2025
Country/TerritoryKorea, Republic of
CityBusan
Period12/10/2515/10/25

Keywords

  • CMOS
  • Lock Detection
  • PLL
  • Sub-Sampling

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