TY - GEN
T1 - A study on the impact of pre-trained model on Just-In-Time defect prediction
AU - Guo, Yuxiang
AU - Gao, Xiaopeng
AU - Zhang, Zhenyu
AU - Chan, W. K.
AU - Jiang, Bo
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Previous researchers conducting Just-In-Time (JIT) defect prediction tasks have primarily focused on the performance of individual pre-trained models, without exploring the relationship between different pre-trained models as backbones. In this study, we build six models: RoBERTaJIT, CodeBERTJIT, BARTJIT, PLBARTJIT, GPT2JIT, and CodeGPTJIT, each with a distinct pre-trained model as its backbone. We systematically explore the differences and connections between these models. Specifically, we investigate the performance of the models when using Commit code and Commit message as inputs, as well as the relationship between training efficiency and model distribution among these six models. Additionally, we conduct an ablation experiment to explore the sensitivity of each model to inputs. Furthermore, we investigate how the models perform in zero-shot and few-shot scenarios. Our findings indicate that each model based on different backbones shows improvements, and when the backbone's pre-training model is similar, the training resources that need to be consumed are closer. We also observe that Commit code plays a significant role in defect detection, and different pre-trained models demonstrate better defect detection ability with a balanced dataset under few-shot scenarios. These results provide new insights for optimizing JIT defect prediction tasks using pre-trained models and highlight the factors that require more attention when constructing such models. Additionally, CodeGPTJIT and GPT2JIT achieved better performance than DeepJIT and CC2Vec on the two datasets respectively under 2000 training samples. These findings emphasize the effectiveness of transformer-based pre-trained models in JIT defect prediction tasks, especially in scenarios with limited training data.
AB - Previous researchers conducting Just-In-Time (JIT) defect prediction tasks have primarily focused on the performance of individual pre-trained models, without exploring the relationship between different pre-trained models as backbones. In this study, we build six models: RoBERTaJIT, CodeBERTJIT, BARTJIT, PLBARTJIT, GPT2JIT, and CodeGPTJIT, each with a distinct pre-trained model as its backbone. We systematically explore the differences and connections between these models. Specifically, we investigate the performance of the models when using Commit code and Commit message as inputs, as well as the relationship between training efficiency and model distribution among these six models. Additionally, we conduct an ablation experiment to explore the sensitivity of each model to inputs. Furthermore, we investigate how the models perform in zero-shot and few-shot scenarios. Our findings indicate that each model based on different backbones shows improvements, and when the backbone's pre-training model is similar, the training resources that need to be consumed are closer. We also observe that Commit code plays a significant role in defect detection, and different pre-trained models demonstrate better defect detection ability with a balanced dataset under few-shot scenarios. These results provide new insights for optimizing JIT defect prediction tasks using pre-trained models and highlight the factors that require more attention when constructing such models. Additionally, CodeGPTJIT and GPT2JIT achieved better performance than DeepJIT and CC2Vec on the two datasets respectively under 2000 training samples. These findings emphasize the effectiveness of transformer-based pre-trained models in JIT defect prediction tasks, especially in scenarios with limited training data.
KW - Just-In-time defect prediction
KW - few-shot scenario
KW - model sensitivity
KW - pre-trained model
UR - https://www.scopus.com/pages/publications/85182502795
U2 - 10.1109/QRS60937.2023.00020
DO - 10.1109/QRS60937.2023.00020
M3 - 会议稿件
AN - SCOPUS:85182502795
T3 - IEEE International Conference on Software Quality, Reliability and Security, QRS
SP - 105
EP - 116
BT - Proceedings - 2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security, QRS 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 23rd IEEE International Conference on Software Quality, Reliability, and Security, QRS 2023
Y2 - 22 October 2023 through 26 October 2023
ER -