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A study on EMC stress-strength interference model and EMC reliability

  • Jian Wu*
  • , Shuguo Xie
  • , Tenglong Ke
  • , Xi Chen
  • , Can Li
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper proposed a new concept named EMC reliability to describe the capability of electromagnetic compatibility from the perspective of probability and statistics. Based on the model of EMC stress and EMC strength, an interference model between them is established to obtain the EMC reliability. The results show that this method could not only forecast the level of electromagnetic compatibility of the system effectively, but also provide a significant reference for EMC design and optimization.

Original languageEnglish
Title of host publication2012 10th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2012
Pages677-680
Number of pages4
DOIs
StatePublished - 2012
Event2012 10th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2012 - Xi'an, China
Duration: 22 Oct 201226 Oct 2012

Publication series

Name2012 10th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2012

Conference

Conference2012 10th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2012
Country/TerritoryChina
CityXi'an
Period22/10/1226/10/12

Keywords

  • EMC
  • interference model
  • reliability
  • statistics

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