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A statistical model to locate faults at input level

  • Ji Wu*
  • , Xiao Xia Jia
  • , Chang Liu
  • , Hai Yan Yang
  • , Chao Liu
  • , Mao Zhong Jin
  • *Corresponding author for this work
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present a statistical model to locate faults at the input level based on the failure patterns and the success patterns. The model neither needs to be fed with software module, code or trace information, nor does it require re-executing the program. To evaluate the model, precision and recall are adopted as the criteria. Five programs are examined and 17 testing experiments are conducted in which the model gains 0.803 in precision and 0.697 in recall on average.

Original languageEnglish
Title of host publicationProceedings - 19th International Conference on Automated Software Engineering, ASE 2004
Pages274-277
Number of pages4
StatePublished - 2004
EventProceedings - 19th International Conference on Automated Software Engineering, ASE 2004 - Linz, Austria
Duration: 20 Sep 200424 Sep 2004

Publication series

NameProceedings - 19th International Conference on Automated Software Engineering, ASE 2004

Conference

ConferenceProceedings - 19th International Conference on Automated Software Engineering, ASE 2004
Country/TerritoryAustria
CityLinz
Period20/09/0424/09/04

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