TY - GEN
T1 - A simulation-based method for EMR assessment of aviation electronic products
AU - Yuan, Zenghui
AU - Chen, Ying
AU - Gao, Lei
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2016/1/18
Y1 - 2016/1/18
N2 - With the application and development of electronic devices, the electromagnetic energy in our surrounding space is gaining rapidly. Especially for those aviation electronic products in the limited space, their characters, such as variety, high density, sensitivity and power, make them susceptible to electromagnetic interference. Traditional electromagnetic compliance (EMC) analysis focuses on EMC design, targeting passing the EMC tests. However, there are few researches on EMC reliability or even the reliability index. Concerning this issue, this paper puts forward to a complete theory to assess the electromagnetic reliability (EMR) of the aviation electronic product. It combines stress-strength interference (SSI) model, probabilistic physics of failure (PPoF) method and simulation analysis, which provides theory support to solve the EMC problems and improve its reliability.
AB - With the application and development of electronic devices, the electromagnetic energy in our surrounding space is gaining rapidly. Especially for those aviation electronic products in the limited space, their characters, such as variety, high density, sensitivity and power, make them susceptible to electromagnetic interference. Traditional electromagnetic compliance (EMC) analysis focuses on EMC design, targeting passing the EMC tests. However, there are few researches on EMC reliability or even the reliability index. Concerning this issue, this paper puts forward to a complete theory to assess the electromagnetic reliability (EMR) of the aviation electronic product. It combines stress-strength interference (SSI) model, probabilistic physics of failure (PPoF) method and simulation analysis, which provides theory support to solve the EMC problems and improve its reliability.
KW - EMC
KW - EMR
KW - PPoF
KW - SSI
KW - simulation
UR - https://www.scopus.com/pages/publications/84962033766
U2 - 10.1109/IEEM.2015.7385802
DO - 10.1109/IEEM.2015.7385802
M3 - 会议稿件
AN - SCOPUS:84962033766
T3 - IEEE International Conference on Industrial Engineering and Engineering Management
SP - 1017
EP - 1021
BT - IEEM 2015 - 2015 IEEE International Conference on Industrial Engineering and Engineering Management
PB - IEEE Computer Society
T2 - IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2015
Y2 - 6 December 2015 through 9 December 2015
ER -