Abstract
Purpose - Electrical capacitance tomography (ECT) and electrical resistance tomography (ERT) are promising techniques for multiphase flow measurement due to their high speed, low cost, non-invasive and visualization features. There are two major difficulties in image reconstruction for ECT and ERT: the "soft-field"effect, and the ill-posedness of the inverse problem, which includes two problems: under-determined problem and the solution is not stable, i.e. is very sensitive to measurement errors and noise. This paper aims to summarize and evaluate various reconstruction algorithms which have been studied and developed in the word for many years and to provide reference for further research and application.Design/methodology/approach - In the past 10 years, various image reconstruction algorithms have been developed to deal with these problems, including in the field of industrial multi-phase flow measurement and biological medical diagnosis. Findings - This paper reviews existing image reconstruction algorithms and the new algorithms proposed by the authors for electrical capacitance tomography and electrical resistance tomography in multi-phase flow measurement and biological medical diagnosis. Originality/value - The authors systematically summarize and evaluate various reconstruction algorithms which have been studied and developed in the word for many years and to provide valuable reference for practical applications.
| Original language | English |
|---|---|
| Pages (from-to) | 429-445 |
| Number of pages | 17 |
| Journal | Sensor Review |
| Volume | 36 |
| Issue number | 4 |
| DOIs | |
| State | Published - 2016 |
| Externally published | Yes |
Keywords
- Electrical capacitance tomography
- Electrical resistance tomography Image reconstruction
- Inverse problem
- Linearization
- Regularization
Fingerprint
Dive into the research topics of 'A review on image reconstruction algorithms for electrical capacitance/resistance tomography'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver