A review of the research on quantitative reliability prediction and assessment for electronic components

  • Yang Zhao*
  • , Xiaoyan Yin
  • , Rui Kang
  • , Kishor S. Trivedi
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A review is carried out on how quantitative approaches have been applied so far to the Reliability Prediction and Assessment (RPA) for computer and communication systems. A series of the reliability evaluation technology based on analytic models and computer simulations are developed for use in product design and test, shape, system operation and maintenance, during a research initiative towards understanding the quantitative characteristics of hardware and software systems. The implementation of these techniques guarantees that the sophisticated system satisfying the high standard on reliability, availability, performability, maintainability and safety. Such approaches conduct quantitative assessment for reliability at the system level. Such reliability quantitative assessments are effectively used in the system decision-making for fault detection, failures elimination, optimization, maintenance and safety.

Original languageEnglish
Title of host publication2011 Prognostics and System Health Management Conference, PHM-Shenzhen 2011
DOIs
StatePublished - 2011
Event2011 Prognostics and System Health Management Conference, PHM-Shenzhen 2011 - Shenzhen, China
Duration: 24 May 201125 May 2011

Publication series

Name2011 Prognostics and System Health Management Conference, PHM-Shenzhen 2011

Conference

Conference2011 Prognostics and System Health Management Conference, PHM-Shenzhen 2011
Country/TerritoryChina
CityShenzhen
Period24/05/1125/05/11

Keywords

  • Assessment
  • Prediction
  • Reliability

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