Skip to main navigation Skip to search Skip to main content

A review of fault prognostics in condition based maintenance

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The main idea of condition based maintenance (CBM) is to monitor the health of critical machine components and system almost continuously during operation and maintenance actions based on the assessed condition. If done correctly, CBM has the benefits such as reducing catastrophic failures, minimizing maintenance and logistical cost, maximizing system security and availability and improving platform reliability. A CBM system usually has four functional modules: feature extraction, diagnostics, prognostics and decision support. Among them, fault prognostics is the most important enabling technology. It is the most challenging research area which is so called crystal ball of CBM. But it has the potential to be the most beneficial one. A review of recent progress of fault prognostics is conducted with the emphasis placed on its algorithmic approaches. These approaches generally fall into four main categories, namely experience-based approaches, model-based approaches, knowledge-based approaches and data-driven approaches. Based on the analysis of some typical examples on each prognostic approaches, the advantages and disadvantages of these approaches are further discussed. Finally, the future challenges concerned with fault prognostics are also presented.

Original languageEnglish
Title of host publicationSixth International Symposium on Instrumentation and Control Technology
Subtitle of host publicationSignal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
DOIs
StatePublished - 2006
EventSitxh International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence - Beijing, China
Duration: 13 Oct 200615 Oct 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6357 II
ISSN (Print)0277-786X

Conference

ConferenceSitxh International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
Country/TerritoryChina
CityBeijing
Period13/10/0615/10/06

Keywords

  • Condition based maintenance (CBM)
  • Fault diagnostics
  • Fault prognostics

Fingerprint

Dive into the research topics of 'A review of fault prognostics in condition based maintenance'. Together they form a unique fingerprint.

Cite this