Skip to main navigation Skip to search Skip to main content

A rafting model for creep of Ni base single crystal at high temperature based on microstructure cell

  • Beihang University

Research output: Contribution to journalArticlepeer-review

Abstract

A rafting model for creep of Ni base single crystal based on microstructure cell was introduced into the dislocation slip model, and the rafting behaviors during creep of DD3 at 1223 K and SRR99 at 1123 K and 1253 K were described in combination with the cell's analytic stress model. By incorporating the changes of the cell's dimensions into the cell stress model, the criterion of rafting type and direction judgment was determined and the rafting deformation was simulated quantitatively. Both the results of rafting direction judgment and the simulation of rafting process were in agreement with experiments. With the introduction of rafting model, the dislocation slip model could simulate the creep behavior of single crystal at high temperature more accurately.

Original languageEnglish
Pages (from-to)1691-1698
Number of pages8
JournalHangkong Dongli Xuebao/Journal of Aerospace Power
Volume24
Issue number8
StatePublished - Aug 2009

Keywords

  • Microstructure cell
  • Ni base single crystal
  • Rafting

Fingerprint

Dive into the research topics of 'A rafting model for creep of Ni base single crystal at high temperature based on microstructure cell'. Together they form a unique fingerprint.

Cite this