A Quad-Tip Wideband E-Field Probe With High Spatial Resolution For Near-Field Measurement

Mahmoud Mohammed; Ahmed Khodeir; Zhaowen Yan; Fuyu Zhao; Tengfei Gao

doi:10.1109/ISAP57493.2023.10388945

A Quad-Tip Wideband E-Field Probe With High Spatial Resolution For Near-Field Measurement

Mahmoud Mohammed
, Ahmed Khodeir
, Zhaowen Yan
, Fuyu Zhao
, Tengfei Gao

School of Electronic and Information Engineering

Beihang University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Abstract

Based on a quad V-shaped tip design, this paper introduces a novel high-performance, low-cost, wideband, and high spatial resolution electric field probe that operates from 10 kHz to 12 GHz for identifying and locating the EMI problem of the electric and electronic systems for near-field measurement. The sensitivity increased to -19 dB which is 8 dB higher than commercial and other introduced probes. The spatial resolution increased to 0.75 mm at 10 GHz. This probe is fabricated in a four-layer printed circuit board (PCB) with high-performance dielectric (RO4450 and RO4003) with a tip width of 4 mm which is very suitable for the narrow and complex PCBs.

Original language	English
Title of host publication	2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9798350341140
DOIs	https://doi.org/10.1109/ISAP57493.2023.10388945
State	Published - 2023
Event	2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023 - Kuala Lumpur, Malaysia Duration: 30 Oct 2023 → 2 Nov 2023

Publication series

Name	2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023

Conference

Conference	2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023
Country/Territory	Malaysia
City	Kuala Lumpur
Period	30/10/23 → 2/11/23

Keywords

EMC
EMI
electric field probe
high sensitivity probe
high spatial resolution
wideband probe

Access to Document

10.1109/ISAP57493.2023.10388945

Cite this

Mohammed, M., Khodeir, A., Yan, Z., Zhao, F., & Gao, T. (2023). A Quad-Tip Wideband E-Field Probe With High Spatial Resolution For Near-Field Measurement. In 2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023 (2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISAP57493.2023.10388945

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title = "A Quad-Tip Wideband E-Field Probe With High Spatial Resolution For Near-Field Measurement",

abstract = "Based on a quad V-shaped tip design, this paper introduces a novel high-performance, low-cost, wideband, and high spatial resolution electric field probe that operates from 10 kHz to 12 GHz for identifying and locating the EMI problem of the electric and electronic systems for near-field measurement. The sensitivity increased to -19 dB which is 8 dB higher than commercial and other introduced probes. The spatial resolution increased to 0.75 mm at 10 GHz. This probe is fabricated in a four-layer printed circuit board (PCB) with high-performance dielectric (RO4450 and RO4003) with a tip width of 4 mm which is very suitable for the narrow and complex PCBs.",

keywords = "EMC, EMI, electric field probe, high sensitivity probe, high spatial resolution, wideband probe",

author = "Mahmoud Mohammed and Ahmed Khodeir and Zhaowen Yan and Fuyu Zhao and Tengfei Gao",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023 ; Conference date: 30-10-2023 Through 02-11-2023",

year = "2023",

doi = "10.1109/ISAP57493.2023.10388945",

language = "英语",

series = "2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023",

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}

Mohammed, M, Khodeir, A, Yan, Z, Zhao, F & Gao, T 2023, A Quad-Tip Wideband E-Field Probe With High Spatial Resolution For Near-Field Measurement. in 2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023. 2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023, Institute of Electrical and Electronics Engineers Inc., 2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023, Kuala Lumpur, Malaysia, 30/10/23. https://doi.org/10.1109/ISAP57493.2023.10388945

A Quad-Tip Wideband E-Field Probe With High Spatial Resolution For Near-Field Measurement. / Mohammed, Mahmoud; Khodeir, Ahmed; Yan, Zhaowen et al.
2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A Quad-Tip Wideband E-Field Probe With High Spatial Resolution For Near-Field Measurement

AU - Mohammed, Mahmoud

AU - Khodeir, Ahmed

AU - Yan, Zhaowen

AU - Zhao, Fuyu

AU - Gao, Tengfei

PY - 2023

Y1 - 2023

N2 - Based on a quad V-shaped tip design, this paper introduces a novel high-performance, low-cost, wideband, and high spatial resolution electric field probe that operates from 10 kHz to 12 GHz for identifying and locating the EMI problem of the electric and electronic systems for near-field measurement. The sensitivity increased to -19 dB which is 8 dB higher than commercial and other introduced probes. The spatial resolution increased to 0.75 mm at 10 GHz. This probe is fabricated in a four-layer printed circuit board (PCB) with high-performance dielectric (RO4450 and RO4003) with a tip width of 4 mm which is very suitable for the narrow and complex PCBs.

AB - Based on a quad V-shaped tip design, this paper introduces a novel high-performance, low-cost, wideband, and high spatial resolution electric field probe that operates from 10 kHz to 12 GHz for identifying and locating the EMI problem of the electric and electronic systems for near-field measurement. The sensitivity increased to -19 dB which is 8 dB higher than commercial and other introduced probes. The spatial resolution increased to 0.75 mm at 10 GHz. This probe is fabricated in a four-layer printed circuit board (PCB) with high-performance dielectric (RO4450 and RO4003) with a tip width of 4 mm which is very suitable for the narrow and complex PCBs.

KW - EMC

KW - EMI

KW - electric field probe

KW - high sensitivity probe

KW - high spatial resolution

KW - wideband probe

UR - https://www.scopus.com/pages/publications/85184824046

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DO - 10.1109/ISAP57493.2023.10388945

M3 - 会议稿件

AN - SCOPUS:85184824046

T3 - 2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023

BT - 2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023

Y2 - 30 October 2023 through 2 November 2023

ER -

Mohammed M, Khodeir A, Yan Z, Zhao F, Gao T. A Quad-Tip Wideband E-Field Probe With High Spatial Resolution For Near-Field Measurement. In 2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023. Institute of Electrical and Electronics Engineers Inc. 2023. (2023 IEEE International Symposium on Antennas and Propagation, ISAP 2023). doi: 10.1109/ISAP57493.2023.10388945

A Quad-Tip Wideband E-Field Probe With High Spatial Resolution For Near-Field Measurement

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Keywords

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