A Proposal for a Uniform Magnetic Focusing System to Improve the Sheet Beam Transmission

  • Wenbo Wang
  • , Cunjun Ruan*
  • , Pengpeng Wang
  • , Yaqi Zhao
  • , Tianyi Xu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

—Sheet electron beam (SEB) has been widely concerned in high-power vacuum electronic devices (VEDs). By enlarging its transverse size, the current of SEB can be further increased under the premise of relatively low current density, thus greatly enhancing the output power. However, the instability of SEB transmission under the focusing of uniform magnetic focusing system (UMFS) limits the further development of SEB-VEDs. In order to solve this problem, a novel and simple method to improve the transmission performance of SEB has been proposed in this article. Based on the conventional UMFS, this method adds two another magnetic blocks with transverse magnetization, and then, the transverse magnetic (TM) field will be generated and will be fully utilized in optimizing the transmission of SEB. Comparative analysis of simulation results shows that under the same strength of the axial magnetic field, using the UMFS with additional TM field (TM-UMFS) to focus the SEB can further increase the electron passing rate by at least 30% compared to the conventional UMFS. The simple structure of TM-UMFS proposed in this article shows the high possibility in the fabricating process and is expected to obtain further development in the high-power SEB-VED industry.

Original languageEnglish
Pages (from-to)1866-1873
Number of pages8
JournalIEEE Transactions on Plasma Science
Volume53
Issue number8
DOIs
StatePublished - 2025

Keywords

  • Diocotron instability
  • passing rate
  • shear force
  • sheet electron beam (SEB)
  • transverse magnetic (TM) field
  • uniform magnetic focusing system (UMFS)

Fingerprint

Dive into the research topics of 'A Proposal for a Uniform Magnetic Focusing System to Improve the Sheet Beam Transmission'. Together they form a unique fingerprint.

Cite this