@inproceedings{e14278bf4cab43218043d28940b1730a,
title = "A probabilistic physics-of-failure reliability assessment approach for integrated LED lamps",
abstract = "This work studies the effect of randomness of LED's lumen depreciation on reliability of the entire LED lamp. An integrated LED light bulb is selected as carrier of the proposed method. A PoF based lumen depreciation model and electronic-thermal simulations are introduced for reliability prediction. The normal distribution is used to describe the statistical distribution of LEDs. The probabilities of the driver's catastrophic failures and lumen can then be obtained by Monte Carlo simulations by considering the increase of lamp's temperature. The effect of the lumen depreciation to the entire lamp is studied with two scenarios: constant light mode and constant current mode.",
author = "Bo Sun and Jiajie Fan and Xuejun Fan and Guoqi Zhang",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018 ; Conference date: 15-04-2018 Through 18-04-2018",
year = "2018",
month = may,
day = "30",
doi = "10.1109/EuroSimE.2018.8369897",
language = "英语",
series = "2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1--5",
booktitle = "2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2018",
address = "美国",
}