@inproceedings{1acbd7d1eb344e239ebd3efd104f752d,
title = "A PoF and statistics combined reliability prediction for LED arrays in lamps",
abstract = "In this work, a physics-of-failure (PoF) reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and catastrophic failures of LEDs. The current in each LED may redistribute when the catastrophic failure occurs in one of LEDs in an array, thus affecting the operation conditions of the entire LED array. A physics-of-failure based reliability prediction methodology is combined with statistical models to consider the interaction between the lumen depreciation and the catastrophic failure. Electronic-thermal simulations are utilized to obtain operation conditions, including temperature and current. Meanwhile, statistical models are applied to calculate possibilities of the catastrophic failure in different operation conditions.",
keywords = "Electrolytic Capacitor-Free LED Driver, MOSFET, Reliability",
author = "Bo Sun and Xuejun Fan and Jiajie Fan and Cheng Qian and Zhang, \{G. Q.\}",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2017 ; Conference date: 03-04-2017 Through 05-04-2017",
year = "2017",
month = may,
day = "10",
doi = "10.1109/EuroSimE.2017.7926264",
language = "英语",
series = "2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2017",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2017",
address = "美国",
}