TY - GEN
T1 - A novel electromagnetic concentrative probe and pulse eddy current nondestructive testing
AU - Xiao, C. Y.
AU - Yang, C. W.
N1 - Publisher Copyright:
© 2015 Taylor & Francis Group, London.
PY - 2015
Y1 - 2015
N2 - The probe is one of the crucial components for the eddy current testing system, determining the detection of useful signals and the measurement sensitivity. In this paper, a novel electromagnetic concentrative probe is designed through simulations by finite element method, which consists of a special-shaped iron core, excitation coils and a magnetic sensor. Through experiments of pulsed eddy current nondestructive testing, the probe’s good performance for detecting deep defect are verified, and its sensitive factors such as excitation frequency, duty ratio and defect position are also studied. The excitation frequency of 5 Hz and duty ratio of 5% are conducive to deep defect detection in the experiments.
AB - The probe is one of the crucial components for the eddy current testing system, determining the detection of useful signals and the measurement sensitivity. In this paper, a novel electromagnetic concentrative probe is designed through simulations by finite element method, which consists of a special-shaped iron core, excitation coils and a magnetic sensor. Through experiments of pulsed eddy current nondestructive testing, the probe’s good performance for detecting deep defect are verified, and its sensitive factors such as excitation frequency, duty ratio and defect position are also studied. The excitation frequency of 5 Hz and duty ratio of 5% are conducive to deep defect detection in the experiments.
UR - https://www.scopus.com/pages/publications/84962204152
M3 - 会议稿件
AN - SCOPUS:84962204152
SN - 9781138028128
T3 - Testing and Measurement: Techniques and Applications - Proceedings of the 2015 International Conference on Testing and Measurement: Techniques and Applications, TMTA 2015
SP - 253
EP - 256
BT - Testing and Measurement
A2 - Chan, Kennis
PB - CRC Press/Balkema
T2 - International Conference on Testing and Measurement: Techniques and Applications, TMTA 2015
Y2 - 16 January 2015 through 17 January 2015
ER -