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A novel circuit design of true random number generator using magnetic tunnel junction

  • CNRS

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Random numbers are widely used in the cryptography and security systems. However, most of the true random number generators (TRNG) which use physical randomness are with high complexity and high power consumption. This paper proposes a new TRNG circuit using magnetic tunnel junction (MTJ). As one of the reliability issues in MTJ based circuit, the stochastic switching behavior provides a perfect physical source of randomness. The functionality of proposed design is validated by transient simulations with 28nm fully depleted silicon-on-insulator (FDSOI) technology and an accurate MTJ compact model. Simulation results show that our design can generate accurate random bitstream stably. The reliability analysis concerning process variation of MTJs and transistors proves the good variability tolerance of our TRNG design. Furthermore, our design can output stable random bitstream around 30 tuning steps.

Original languageEnglish
Title of host publicationProceedings of the 2016 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2016
PublisherPresses Polytechniques Et Universitaires Romandes
Pages123-128
Number of pages6
ISBN (Electronic)9781450343305
DOIs
StatePublished - 14 Sep 2016
Event2016 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2016 - Beijing, China
Duration: 18 Jul 2016 → 20 Jul 2016

Publication series

NameProceedings of the 2016 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2016

Conference

Conference2016 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH 2016
Country/TerritoryChina
CityBeijing
Period18/07/16 → 20/07/16

Keywords

  • FDSOI
  • magnetic tunnel junction
  • process variation
  • stochastic switching
  • true random number generator

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