A New Methodology to Identify the Conducted Emission Source of Integrated Circuits

Yuanhao Li; Shuguo Xie; Chenji Zhao

doi:10.1109/ISAPE54070.2021.9753587

A New Methodology to Identify the Conducted Emission Source of Integrated Circuits

Yuanhao Li
, Shuguo Xie
, Chenji Zhao

School of Electronic and Information Engineering

Beihang University
China Aviation Industry Corporation

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

In this paper, we introduce a new method for identifying internal conducted emission (CE) source of Integrated Circuits (ICs). By studying the spectrum characteristics of three typical internal interference sources, sine wave, square wave and spike, and the general characteristics of the power distribution network (PDN) transfer functions of ICs, the envelope detrending method is proposed, which combines machine learning and classification algorithms to make it possible to identify the conducted emission source of ICs.

Original language	English
Title of host publication	13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665418126
DOIs	https://doi.org/10.1109/ISAPE54070.2021.9753587
State	Published - 2021
Event	13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Zhuhai, China Duration: 1 Dec 2021 → 4 Dec 2021

Publication series

Name	13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings

Conference

Conference	13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021
Country/Territory	China
City	Zhuhai
Period	1/12/21 → 4/12/21

Keywords

classification algorithm
conducted emission
envelope detrending method
Integrated Circuits
power distribution network

Access to Document

10.1109/ISAPE54070.2021.9753587

Cite this

Li, Y., Xie, S., & Zhao, C. (2021). A New Methodology to Identify the Conducted Emission Source of Integrated Circuits. In 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings (13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISAPE54070.2021.9753587

Li, Yuanhao ; Xie, Shuguo ; Zhao, Chenji. / A New Methodology to Identify the Conducted Emission Source of Integrated Circuits. 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. (13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings).

@inproceedings{d2d2993762e149899ce0c08401a43112,

title = "A New Methodology to Identify the Conducted Emission Source of Integrated Circuits",

abstract = "In this paper, we introduce a new method for identifying internal conducted emission (CE) source of Integrated Circuits (ICs). By studying the spectrum characteristics of three typical internal interference sources, sine wave, square wave and spike, and the general characteristics of the power distribution network (PDN) transfer functions of ICs, the envelope detrending method is proposed, which combines machine learning and classification algorithms to make it possible to identify the conducted emission source of ICs.",

keywords = "classification algorithm, conducted emission, envelope detrending method, Integrated Circuits, power distribution network",

author = "Yuanhao Li and Shuguo Xie and Chenji Zhao",

note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 ; Conference date: 01-12-2021 Through 04-12-2021",

year = "2021",

doi = "10.1109/ISAPE54070.2021.9753587",

language = "英语",

series = "13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings",

address = "美国",

}

Li, Y, Xie, S & Zhao, C 2021, A New Methodology to Identify the Conducted Emission Source of Integrated Circuits. in 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings. 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021, Zhuhai, China, 1/12/21. https://doi.org/10.1109/ISAPE54070.2021.9753587

A New Methodology to Identify the Conducted Emission Source of Integrated Circuits. / Li, Yuanhao; Xie, Shuguo; Zhao, Chenji.
13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2021. (13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A New Methodology to Identify the Conducted Emission Source of Integrated Circuits

AU - Li, Yuanhao

AU - Xie, Shuguo

AU - Zhao, Chenji

PY - 2021

Y1 - 2021

N2 - In this paper, we introduce a new method for identifying internal conducted emission (CE) source of Integrated Circuits (ICs). By studying the spectrum characteristics of three typical internal interference sources, sine wave, square wave and spike, and the general characteristics of the power distribution network (PDN) transfer functions of ICs, the envelope detrending method is proposed, which combines machine learning and classification algorithms to make it possible to identify the conducted emission source of ICs.

AB - In this paper, we introduce a new method for identifying internal conducted emission (CE) source of Integrated Circuits (ICs). By studying the spectrum characteristics of three typical internal interference sources, sine wave, square wave and spike, and the general characteristics of the power distribution network (PDN) transfer functions of ICs, the envelope detrending method is proposed, which combines machine learning and classification algorithms to make it possible to identify the conducted emission source of ICs.

KW - classification algorithm

KW - conducted emission

KW - envelope detrending method

KW - Integrated Circuits

KW - power distribution network

UR - https://www.scopus.com/pages/publications/85129379187

U2 - 10.1109/ISAPE54070.2021.9753587

DO - 10.1109/ISAPE54070.2021.9753587

M3 - 会议稿件

AN - SCOPUS:85129379187

T3 - 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings

BT - 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021

Y2 - 1 December 2021 through 4 December 2021

ER -

Li Y, Xie S, Zhao C. A New Methodology to Identify the Conducted Emission Source of Integrated Circuits. In 13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2021. (13th International Symposium on Antennas, Propagation and EM Theory, ISAPE 2021 - Proceedings). doi: 10.1109/ISAPE54070.2021.9753587

A New Methodology to Identify the Conducted Emission Source of Integrated Circuits

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