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A new method for power flicker measurement based on interpolated DFT

  • Jin Haibin*
  • , Bin Wang
  • , Jing Wu
  • , Kai Jia
  • *Corresponding author for this work
  • Beijing Orient Institute of Metrology and Measurement Technology
  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Measuring power flicker is important in assessing the quality of the electric power. This paper introduces a new method on measuring the modulation ratio of voltage in flicker. We divide the samples of the fluctuating voltage into several groups according to its period. Then the interpolated discrete Fourier transform(DFT) based on Hanning window is used to analyze the rms of each period of samples. All of rms are sorted from small to large. The maximum and minimum rms are used to calculate the modulation ratio of the flicker. The simulation results show that the accuracy of the proposed method is high and it has a rapid computation speed.

Original languageEnglish
Title of host publication2011 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2011 - Proceedings
Pages221-224
Number of pages4
DOIs
StatePublished - 2011
Event2011 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2011 - Binjiang, Hangzhou, China
Duration: 10 May 201112 May 2011

Publication series

NameConference Record - IEEE Instrumentation and Measurement Technology Conference
ISSN (Print)1091-5281

Conference

Conference2011 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2011
Country/TerritoryChina
CityBinjiang, Hangzhou
Period10/05/1112/05/11

Keywords

  • discrete Fourier transform
  • flicker
  • Hanning window
  • modulation ratio of voltag
  • simulation

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