A new FPGA PUF based on transition probability delay measurement

Zhenyu Guan; Yuyao Qin; Junming Liu

doi:10.1007/978-981-10-7080-8_6

A new FPGA PUF based on transition probability delay measurement

Zhenyu Guan
, Yuyao Qin^*
, Junming Liu

^*Corresponding author for this work

School of Cyber Science and Technology

Beihang University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

By extracting the physical random differences produced in the manufacturing process on chip itself, a unique identification of any FPGA could be obtained with certain excitation, which has brought new opportunities to research and development of key generation and storage. Based on the transition probability method to measure the delay of LUT, this paper proposes a new PUF (Physical Unclonable Function) scheme. By choosing the LUT under measurement intentionally, such as 2D barcode, it realizes the multi-dimensional information utilization. An overlapping route comparison method is adopted in this scheme to measure the delay of a single LUT with high accuracy and low resource consumption, which has been significantly optimized compared to previous work in accuracy, granularity and resource consumption.

Original language	English
Title of host publication	Trusted Computing and Information Security - 11th Chinese Conference, CTCIS 2017, Proceedings
Editors	Fei Yan, Ming Xu, Shaojing Fu, Zheng Qin
Publisher	Springer Verlag
Pages	66-75
Number of pages	10
ISBN (Print)	9789811070792
DOIs	https://doi.org/10.1007/978-981-10-7080-8_6
State	Published - 2017
Event	11th Chinese Conference on Trusted Computing and Information Security, CTCIS 2017 - Changsha, China Duration: 14 Sep 2017 → 17 Sep 2017

Publication series

Name	Communications in Computer and Information Science
Volume	704
ISSN (Print)	1865-0929

Conference

Conference	11th Chinese Conference on Trusted Computing and Information Security, CTCIS 2017
Country/Territory	China
City	Changsha
Period	14/09/17 → 17/09/17

Keywords

LUT
Multi-dimensional information utilization
PUF (physical unclonable function)
Transition probability

Access to Document

10.1007/978-981-10-7080-8_6

Cite this

Guan, Z., Qin, Y., & Liu, J. (2017). A new FPGA PUF based on transition probability delay measurement. In F. Yan, M. Xu, S. Fu, & Z. Qin (Eds.), Trusted Computing and Information Security - 11th Chinese Conference, CTCIS 2017, Proceedings (pp. 66-75). (Communications in Computer and Information Science; Vol. 704). Springer Verlag. https://doi.org/10.1007/978-981-10-7080-8_6

@inproceedings{6e686ae89d1743d1b1ed63c95390952a,

title = "A new FPGA PUF based on transition probability delay measurement",

abstract = "By extracting the physical random differences produced in the manufacturing process on chip itself, a unique identification of any FPGA could be obtained with certain excitation, which has brought new opportunities to research and development of key generation and storage. Based on the transition probability method to measure the delay of LUT, this paper proposes a new PUF (Physical Unclonable Function) scheme. By choosing the LUT under measurement intentionally, such as 2D barcode, it realizes the multi-dimensional information utilization. An overlapping route comparison method is adopted in this scheme to measure the delay of a single LUT with high accuracy and low resource consumption, which has been significantly optimized compared to previous work in accuracy, granularity and resource consumption.",

keywords = "LUT, Multi-dimensional information utilization, PUF (physical unclonable function), Transition probability",

author = "Zhenyu Guan and Yuyao Qin and Junming Liu",

note = "Publisher Copyright: {\textcopyright} Springer Nature Singapore Pte Ltd. 2017.; 11th Chinese Conference on Trusted Computing and Information Security, CTCIS 2017 ; Conference date: 14-09-2017 Through 17-09-2017",

year = "2017",

doi = "10.1007/978-981-10-7080-8\_6",

language = "英语",

isbn = "9789811070792",

series = "Communications in Computer and Information Science",

publisher = "Springer Verlag",

pages = "66--75",

editor = "Fei Yan and Ming Xu and Shaojing Fu and Zheng Qin",

booktitle = "Trusted Computing and Information Security - 11th Chinese Conference, CTCIS 2017, Proceedings",

address = "德国",

}

Guan, Z, Qin, Y & Liu, J 2017, A new FPGA PUF based on transition probability delay measurement. in F Yan, M Xu, S Fu & Z Qin (eds), Trusted Computing and Information Security - 11th Chinese Conference, CTCIS 2017, Proceedings. Communications in Computer and Information Science, vol. 704, Springer Verlag, pp. 66-75, 11th Chinese Conference on Trusted Computing and Information Security, CTCIS 2017, Changsha, China, 14/09/17. https://doi.org/10.1007/978-981-10-7080-8_6

A new FPGA PUF based on transition probability delay measurement. / Guan, Zhenyu; Qin, Yuyao; Liu, Junming.
Trusted Computing and Information Security - 11th Chinese Conference, CTCIS 2017, Proceedings. ed. / Fei Yan; Ming Xu; Shaojing Fu; Zheng Qin. Springer Verlag, 2017. p. 66-75 (Communications in Computer and Information Science; Vol. 704).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - A new FPGA PUF based on transition probability delay measurement

AU - Guan, Zhenyu

AU - Qin, Yuyao

AU - Liu, Junming

N1 - Publisher Copyright: © Springer Nature Singapore Pte Ltd. 2017.

PY - 2017

Y1 - 2017

N2 - By extracting the physical random differences produced in the manufacturing process on chip itself, a unique identification of any FPGA could be obtained with certain excitation, which has brought new opportunities to research and development of key generation and storage. Based on the transition probability method to measure the delay of LUT, this paper proposes a new PUF (Physical Unclonable Function) scheme. By choosing the LUT under measurement intentionally, such as 2D barcode, it realizes the multi-dimensional information utilization. An overlapping route comparison method is adopted in this scheme to measure the delay of a single LUT with high accuracy and low resource consumption, which has been significantly optimized compared to previous work in accuracy, granularity and resource consumption.

AB - By extracting the physical random differences produced in the manufacturing process on chip itself, a unique identification of any FPGA could be obtained with certain excitation, which has brought new opportunities to research and development of key generation and storage. Based on the transition probability method to measure the delay of LUT, this paper proposes a new PUF (Physical Unclonable Function) scheme. By choosing the LUT under measurement intentionally, such as 2D barcode, it realizes the multi-dimensional information utilization. An overlapping route comparison method is adopted in this scheme to measure the delay of a single LUT with high accuracy and low resource consumption, which has been significantly optimized compared to previous work in accuracy, granularity and resource consumption.

KW - LUT

KW - Multi-dimensional information utilization

KW - PUF (physical unclonable function)

KW - Transition probability

UR - https://www.scopus.com/pages/publications/85036478168

U2 - 10.1007/978-981-10-7080-8_6

DO - 10.1007/978-981-10-7080-8_6

M3 - 会议稿件

AN - SCOPUS:85036478168

SN - 9789811070792

T3 - Communications in Computer and Information Science

SP - 66

EP - 75

BT - Trusted Computing and Information Security - 11th Chinese Conference, CTCIS 2017, Proceedings

A2 - Yan, Fei

A2 - Xu, Ming

A2 - Fu, Shaojing

A2 - Qin, Zheng

PB - Springer Verlag

T2 - 11th Chinese Conference on Trusted Computing and Information Security, CTCIS 2017

Y2 - 14 September 2017 through 17 September 2017

ER -

A new FPGA PUF based on transition probability delay measurement

Abstract

Publication series

Conference

Keywords

Access to Document

Other files and links

Fingerprint

Cite this