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A new analytical inversion to Fraunhofer diffraction

  • Beihang University

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

An analytical inversion to the particle sizing problem in Fraunhofer diffraction was introduced in this paper. Compared with the well known Chin-Shifrin inversion, it is an inversion of the integral transform and less sensitive to the noise. Simulation results with 0.1% noise were obtained and show that the new inversion performs well even in the case of noisy data, where the Chin-Shifrin method does not converge.

Original languageEnglish
Title of host publication2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009
Pages507-510
Number of pages4
DOIs
StatePublished - 2009
Event2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009 - Singapore, Singapore
Duration: 5 May 20097 May 2009

Publication series

Name2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009

Conference

Conference2009 IEEE Intrumentation and Measurement Technology Conference, I2MTC 2009
Country/TerritorySingapore
CitySingapore
Period5/05/097/05/09

Keywords

  • Fraunhofer diffraction
  • Integral transform
  • Particle size

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