TY - GEN
T1 - A Multi-Factor Comprehensive Testability Allocation Method Based on Expert Scoring
AU - Shi, Junyou
AU - Yang, Zhilin
AU - Zhou, Huidong
AU - Lv, Zhenyang
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - To address the limitations of traditional testability allocation methods in terms of data dependency and lack of specificity, this paper proposes a multi-factor comprehensive testability allocation method based on expert scoring. The method selects four key factors, including fault occurrence count, degree of electrification, condition monitoring coverage, and proportion of simply diagnosable faults, and determines their weights through independent scoring by multiple experts. A piecewise function model is employed to achieve a rational allocation of testability metrics. A typical vehicle powertrain system is used as an example to demonstrate the method.
AB - To address the limitations of traditional testability allocation methods in terms of data dependency and lack of specificity, this paper proposes a multi-factor comprehensive testability allocation method based on expert scoring. The method selects four key factors, including fault occurrence count, degree of electrification, condition monitoring coverage, and proportion of simply diagnosable faults, and determines their weights through independent scoring by multiple experts. A piecewise function model is employed to achieve a rational allocation of testability metrics. A typical vehicle powertrain system is used as an example to demonstrate the method.
KW - expert scoring
KW - multiple factors
KW - powertrain system
KW - testability allocation
UR - https://www.scopus.com/pages/publications/105032874926
U2 - 10.1109/SRSE67406.2025.11357314
DO - 10.1109/SRSE67406.2025.11357314
M3 - 会议稿件
AN - SCOPUS:105032874926
T3 - 2025 7th International Conference on System Reliability and Safety Engineering, SRSE 2025
SP - 577
EP - 581
BT - 2025 7th International Conference on System Reliability and Safety Engineering, SRSE 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 7th International Conference on System Reliability and Safety Engineering, SRSE 2025
Y2 - 20 November 2025 through 23 November 2025
ER -