TY - GEN
T1 - A model-driven testing framework based on requirement for embedded software
AU - Lei, Haishen
AU - Wang, Yichen
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2017/9/25
Y1 - 2017/9/25
N2 - Based on hardware and software integration testing and model driven testing binding requirements, we propose a model based on the needs of embedded software driver initial framework to analyze and identify the needs of embedded systems hardware and software object creation object interaction model, then the model analysis and testing constraints and on the basis of test scenarios, and then establish MARTE model test requirements, test cases accordingly converted into XML model, obtain the initial set of test cases through model transformation algorithm and model checking, and finally the use of intelligent algorithms to obtain objective test set. Expectations for increasing demand for embedded software in line with the degree of automation of the verification process, the verification and running on the target machine's software to achieve high-level functions and needs consistency.
AB - Based on hardware and software integration testing and model driven testing binding requirements, we propose a model based on the needs of embedded software driver initial framework to analyze and identify the needs of embedded systems hardware and software object creation object interaction model, then the model analysis and testing constraints and on the basis of test scenarios, and then establish MARTE model test requirements, test cases accordingly converted into XML model, obtain the initial set of test cases through model transformation algorithm and model checking, and finally the use of intelligent algorithms to obtain objective test set. Expectations for increasing demand for embedded software in line with the degree of automation of the verification process, the verification and running on the target machine's software to achieve high-level functions and needs consistency.
KW - Based on requirement
KW - Intelligent Algorithm
KW - Model driven testing
KW - Test requirements model
KW - UML
UR - https://www.scopus.com/pages/publications/85032796187
U2 - 10.1109/ICRMS.2016.8050100
DO - 10.1109/ICRMS.2016.8050100
M3 - 会议稿件
AN - SCOPUS:85032796187
T3 - Proceedings of 2016 11th International Conference on Reliability, Maintainability and Safety: Integrating Big Data, Improving Reliability and Serving Personalization, ICRMS 2016
BT - Proceedings of 2016 11th International Conference on Reliability, Maintainability and Safety
A2 - Chen, Wenhua
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th International Conference on Reliability, Maintainability and Safety, ICRMS 2016
Y2 - 26 October 2016 through 28 October 2016
ER -