@inproceedings{38bbbdf367954ba49440275221fb9a1f,
title = "A method of testability optimization based on BIT working mode considering the basic reliability",
abstract = "Testability optimization is an important part of testability design. In the past, testability optimization design often neglects the correlation between testability and reliability and does not pay much attention to the influence of system reliability. Considering such circumstance, this paper studies the impact of the basic reliability of the system and the Built-In Test (BIT) working mode. Different optimization models for the testability design are established. A method of testability optimization based on BIT working mode considering the basic reliability is proposed. The fiber-optic inertia system is taken as an example to verify the method. The simulation proves the applicability and effectiveness.",
keywords = "Built-In Test, basic reliability, genetic algorithm, testability",
author = "Junyou Shi and Xuhao Guo and Wenzhe Li",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 8th IEEE Prognostics and System Health Management Conference, PHM-Harbin 2017 ; Conference date: 09-07-2017 Through 12-07-2017",
year = "2017",
month = oct,
day = "20",
doi = "10.1109/PHM.2017.8079175",
language = "英语",
series = "2017 Prognostics and System Health Management Conference, PHM-Harbin 2017 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
editor = "Bin Zhang and Yu Peng and Haitao Liao and Datong Liu and Shaojun Wang and Qiang Miao",
booktitle = "2017 Prognostics and System Health Management Conference, PHM-Harbin 2017 - Proceedings",
address = "美国",
}