TY - GEN
T1 - A life evaluation method of film capacitor using accelerated life testing
AU - Dong, Dongni
AU - Zhang, Wenjin
AU - Chen, Zhengyang
AU - Lu, Kaiyuan
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2017/9/25
Y1 - 2017/9/25
N2 - With the rapid development of science and technology, and the continuous improvement of industrial manufacturing and reliability, the quantitative assessment of reliability and life is very important. As a kind of high-reliability and long-life product, film capacitor is widely used in communication, locomotive, and wind power generation, etc. Such a situation presents higher requirements for the life assessment method of film capacitors. Generally, we use the method of accelerated life testing for the evaluation of the product life of high-reliability and long-life. In order to assess the life of the film capacitor effectively and accurately, then further study the life situation of the system which film capacitor in, this paper is based on the cumulative failure model, through the analysis of the film capacitor failure conditions. What's more, this paper determines the lifetime distribution and acceleration model. Then optimizes accelerated life testing by using genetic algorithm and D-optimal. At last, Monte Carlo simulation is used to verify the testing optimum design.
AB - With the rapid development of science and technology, and the continuous improvement of industrial manufacturing and reliability, the quantitative assessment of reliability and life is very important. As a kind of high-reliability and long-life product, film capacitor is widely used in communication, locomotive, and wind power generation, etc. Such a situation presents higher requirements for the life assessment method of film capacitors. Generally, we use the method of accelerated life testing for the evaluation of the product life of high-reliability and long-life. In order to assess the life of the film capacitor effectively and accurately, then further study the life situation of the system which film capacitor in, this paper is based on the cumulative failure model, through the analysis of the film capacitor failure conditions. What's more, this paper determines the lifetime distribution and acceleration model. Then optimizes accelerated life testing by using genetic algorithm and D-optimal. At last, Monte Carlo simulation is used to verify the testing optimum design.
KW - Accelerated life testing
KW - Film capacitors
KW - Life evaluation method
KW - Step-down-stress testing
UR - https://www.scopus.com/pages/publications/85032801176
U2 - 10.1109/ICRMS.2016.8050080
DO - 10.1109/ICRMS.2016.8050080
M3 - 会议稿件
AN - SCOPUS:85032801176
T3 - Proceedings of 2016 11th International Conference on Reliability, Maintainability and Safety: Integrating Big Data, Improving Reliability and Serving Personalization, ICRMS 2016
BT - Proceedings of 2016 11th International Conference on Reliability, Maintainability and Safety
A2 - Chen, Wenhua
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 11th International Conference on Reliability, Maintainability and Safety, ICRMS 2016
Y2 - 26 October 2016 through 28 October 2016
ER -