Abstract
Atomic force microscopes are a key tool in nanotechnology that overcome the limitations of optical microscopes and provide imaging capabilities with nanoscale resolution. We have developed an atomic force microscope that uses an inexpensive quartz tuning fork as a micro cantilever. Because of its ease of operation and its open structure, it can be easily customized by students. Due to its low costs, it is possible that every student in the course has access to one setup, allowing all students to obtain deep insights into nanotechnology and to understand the principles of atomic force microscopy.
| Original language | English |
|---|---|
| Pages (from-to) | 478-486 |
| Number of pages | 9 |
| Journal | American Journal of Physics |
| Volume | 84 |
| Issue number | 6 |
| DOIs | |
| State | Published - 1 Jun 2016 |
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