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A gray correlation based Bayesian network model for fault source diagnosis of multistage process – Small sample manufacturing system

  • Kaiyang Chu
  • , Rui Liu*
  • , Guijiang Duan
  • *Corresponding author for this work
  • Beihang University
  • Beige Institute

Research output: Contribution to journalArticlepeer-review

Abstract

Fault source diagnosis methodology is one of the key technologies of quality control and assurance for multi-source & multi-stage manufacturing processes, especially in small sample manufacturing systems. By analyzing the existing research on fault source diagnosis methods, a Bayesian network-based methodology is proposed. Gray correlation theory and mechanism analysis method are used in the process of Bayesian network model construction to reduce the dependence of sample data size for structure learning in the process of small sample manufacturing of complex products. In addition, two fault source diagnosis methods based on manufacturing principle analysis and reverse Bayesian network respectively are proposed. The strategy of the combined use of the two methods in the actual manufacturing scenes is given to cope with the fault source diagnosis scenario in the real manufacturing process. In the end, an example from an actual factory is provided to validate the effectiveness and efficiency of the proposed model and methodologies.

Original languageEnglish
Article number101918
JournalAdvanced Engineering Informatics
Volume56
DOIs
StatePublished - Apr 2023

Keywords

  • Bayesian network
  • Fault source diagnosis
  • Gray correlation
  • Multistage process manufacturing
  • Small sample manufacturing

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